• Overview of Chinese core journals
  • Chinese Science Citation Database(CSCD)
  • Chinese Scientific and Technological Paper and Citation Database (CSTPCD)
  • China National Knowledge Infrastructure(CNKI)
  • Chinese Science Abstracts Database(CSAD)
  • JST China
  • SCOPUS
JI Lina, DENG Jianxun, WANG Juan, HUANG Zuohua. A Study of the Optical Constants and Euler Angle of Anisotropic Thin Film with the Single-wavelength Ellipsometer[J]. Journal of South China Normal University (Natural Science Edition), 2019, 51(4): 14-20. DOI: 10.6054/j.jscnun.2019058
Citation: JI Lina, DENG Jianxun, WANG Juan, HUANG Zuohua. A Study of the Optical Constants and Euler Angle of Anisotropic Thin Film with the Single-wavelength Ellipsometer[J]. Journal of South China Normal University (Natural Science Edition), 2019, 51(4): 14-20. DOI: 10.6054/j.jscnun.2019058

A Study of the Optical Constants and Euler Angle of Anisotropic Thin Film with the Single-wavelength Ellipsometer

More Information
  • Received Date: January 06, 2019
  • Available Online: March 21, 2021
  • Based on the principle of ellipsometry and the 4×4 matrix method, a way of measuring the parameters of anisotropic films whose optical axis is parallel to the surface with the single-wavelength ellipsometer is proposed, the parameters including birefringence, thickness and Euler angle. Two sets of ellipsometric parameters can be obtained by rotating the sample at 90°, and four film parameters of the anisotropic film can be obtained with the inversion algorithm to invert two sets of ellipsometric parameters.The effects of incident angle, film thickness, Euler angle and its rotation error on measurement accuracy are discussed with numerical simulation. The ellipsometric parameters of the polyimide film whose optical axis parallels its surface are measured and inverted. The results show that the algorithm has good stability and high precision and the ordinary refractive index, extraordinary refractive index, thickness and Euler angle are 0.000 1, 0.000 1, 0.1 nm and 0.03° respectively. The maximum measurement errors of ordinary refractive index, extraordinary refractive index and thickness are 0.001 2, 0.004 4 and 4.57 nm respectively. This method has good measurement stability, self-consistency and reliability as well as the advantages of simple measurement process and low requirement for instruments. This method extends the measurement range of single-wavelength ellipsometer and the way of measuring anisotropic film, so it has practical significance.
  • [1]
    KAMINSKA K, ROBBIE K. Birefringent omnidirectional reflector[J]. Applied Optics, 2004, 43(7):1570-1576. doi: 10.1364/AO.43.001570
    [2]
    詹媛媛, 俞燕蕾, 李楠, 等.液晶聚合物分子排列调控的研究进展[J].华南师范大学学报(自然科学版), 2017, 49(1):1-8. http://d.old.wanfangdata.com.cn/Periodical/hnsfdx201701001

    ZHAN Y, YU Y, LI N, et al. Research progress on modulation of molecular alignment of liquid crystalline polymers[J]. Journal of South China Normal University (Natural Science Edition), 2017, 49(1):1-8. http://d.old.wanfangdata.com.cn/Periodical/hnsfdx201701001
    [3]
    WANG H. Analysis of anisotropic thin film parameters from prism coupler measurements[J]. Journal of Modern Optics, 1995, 42(11):2173-2181. doi: 10.1080/09500349514551891
    [4]
    JEN Y J, CHIANG C L. Enhanced polarization conversion for an anisotropic thin film[J]. Optics Communications, 2006, 265(2):446-453. doi: 10.1016/j.optcom.2006.03.060
    [5]
    FUJIWARA H. Spectroscopic ellipsometry:principles and applications[M]. Tokyo:Maruzen Co. Ltd, 2007:209-303.
    [6]
    穆全全, 刘永军, 胡立发, 等.光谱型椭偏仪对各向异性液晶层的测量[J].物理学报, 2006, 55(3):1055-1060. doi: 10.3321/j.issn:1000-3290.2006.03.010

    MU Q Q, LIU Y J, HU L F, et al. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer[J]. Acta Physica Sinica, 2006, 55(3):1055-1060. doi: 10.3321/j.issn:1000-3290.2006.03.010
    [7]
    TOKAS R B, JENA S, HAQUE S M, et al. Spectroscopic ellipsometry investigations of optical anisotropy in obliquely deposited hafnia thin films[C]//Dae Solid State Phate Physics Symposium.[S.l]: AIP Conference Proceedings, 2016, 060007/1-3.
    [8]
    ISIK M, GASANLY N M. Optical parameters of anisotro-pic chain-structured Tl2InGaTe4 crystals by spectroscopic ellipsometry[J]. Optik, 2016, 127(22):10637-10642. doi: 10.1016/j.ijleo.2016.08.097
    [9]
    TOMIYAMA T, YAMAZAKI H. Optical anisotropy studies of silver nanowire/polymer composite films with Mueller matrix ellipsometry[J]. Applied Surface Science, 2017, 421:831-836. doi: 10.1016/j.apsusc.2017.01.152
    [10]
    WESTPHAL P, KALTENBACH J M, WICKER K. Corneal birefringence measured by spectrally resolved Mueller matrix ellipsometry and implications for non-invasive glucose monitoring[J]. Biomedical Optics Express, 2016, 7(4):1160-1174. doi: 10.1364/BOE.7.001160
    [11]
    POSTAVA K, SYKORA R, LEGUT D, et al. Determination of anisotropic crystal optical properties using Mueller matrix spectroscopic ellipsometry[J]. Procedia Materials Science, 2016, 12:118-123. doi: 10.1016/j.mspro.2016.03.021
    [12]
    PHAN Q H, LO Y L. Characterization of optical/physical properties of anisotropic thin films with rough surfaces by Stokes-Mueller ellipsometry[J]. Optical Materials Express, 2016, 6(6):1774-1789. doi: 10.1364/OME.6.001774
    [13]
    KAMPEN T U, PARAIAN A M, ROSSOW U, et al. Optical anisotropy of organic layers deposited on semiconductor surfaces[J]. Physica Status Solidi A, 2001, 188(4):1307-1317. doi: 10.1002/1521-396X(200112)188:4<1307::AID-PSSA1307>3.0.CO;2-8
    [14]
    LO Y L, HSIEH W H, CHUNG Y F, et al. An approach for measuring the ellipsometric parameters of isotropic and anisotropic thin films using the Stokes parameter method[J]. Journal of Lightwave Technology, 2012, 30(14):2299-2306. doi: 10.1109/JLT.2012.2196977
    [15]
    LO Y L, CHUNG Y F, LIN H H. Polarization scanning ellipsometry method for measuring effective ellipsometric parameters of isotropic and anisotropic thin films[J]. Journal of Lightwave Technology, 2013, 31(14), 2361-2369. doi: 10.1109/JLT.2013.2265716
    [16]
    SCHUBERT M. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems[J]. Physical Review B, 1996, 53(8):4265-4274. doi: 10.1103/PhysRevB.53.4265
    [17]
    陈宝林.最优化理论与算法[M].北京:清华大学出版社, 2005:334-432.
    [18]
    FAN L, HUANG Z. Simulated annealing-simplex hybrid algorithm for ellipsometric data inversion of multilayer films[J]. Review of Scientific Instruments, 2013, 84(6):063103/1-4. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=30d5a6682815a54895fe0af7a8d10de0
  • Cited by

    Periodical cited type(11)

    1. 严群,靳涵宇,宋忠贤,康海彦,延旭,毛艳丽. 活性污泥生物炭的制备及吸附性能的研究进展. 有色金属科学与工程. 2024(04): 615-622 .
    2. 张立国,潘静诗,黄嘉莉,李碧清,唐霞,吴学伟,梁浩斌,杜馨. 废弃物基生物质炭从水体中吸附磷的研究进展. 华南师范大学学报(自然科学版). 2023(06): 36-45 .
    3. 赵伟繁,戴亮,王刚,未碧贵,韩涛. 污泥生物炭重金属吸附剂的制备及改性研究进展. 功能材料. 2020(11): 11083-11088+11115 .
    4. 李芬,王鹤,张彦平,于彩莲,王奇飞. 草木灰浸取液活化制备污泥基脱H_2S碳材料研究. 哈尔滨理工大学学报. 2019(05): 138-144 .
    5. 刘蕾,付临汝,杜馨,张立国,吴宏海,肖羽堂. 联合改性污泥吸附剂去除废水中铬(Ⅵ). 环境化学. 2018(12): 2596-2602 .
    6. 周树烽,陈成广,刘允初,胡艺,胡保卫. KOH改性污泥生物碳及对富营养化水体吸附研究. 环境科学与技术. 2017(08): 43-49 .
    7. 龙良俊,王里奥,余纯丽,魏星跃,卓琳. 改性污泥腐殖酸的表征及其对Cu~(2+)的吸附特性. 中国环境科学. 2017(03): 1016-1023 .
    8. 杨乐,李政家,邓辉,陈尚学,姬江浩. KOH活化-微波热解制备污泥炭及其结构演化. 环境工程. 2016(08): 120-124+129 .
    9. 刘慧君,尹文霞,张立国,付临汝,刘蕾,吴宏海,肖羽堂,吴培煜,石思琦. 碳氮共掺杂污泥基吸附剂去除水中Cr(Ⅵ). 环境工程学报. 2016(08): 4147-4152 .
    10. 邓辉,李政家,金志文,张涛. 棉秆与污泥共热解制备生物炭工艺优化及其结构与吸附性能. 农业工程学报. 2016(24): 248-254 .
    11. 邓辉,杨乐,吴湧道,李钰琦,李政家. 磷酸活化-微波热解制备污泥吸附剂及其结构演化. 石河子大学学报(自然科学版). 2016(01): 85-91 .

    Other cited types(8)

Catalog

    Article views (2028) PDF downloads (111) Cited by(19)

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return