基区重掺杂对InGaAs/InAlAs突变HBT电流输运的影响

吴利锋, 唐吉玉, 文于华, 汤莉莉, 刘超

吴利锋, 唐吉玉, 文于华, 汤莉莉, 刘超. 基区重掺杂对InGaAs/InAlAs突变HBT电流输运的影响[J]. 华南师范大学学报(自然科学版), 2009, 1(1): 49-51 .
引用本文: 吴利锋, 唐吉玉, 文于华, 汤莉莉, 刘超. 基区重掺杂对InGaAs/InAlAs突变HBT电流输运的影响[J]. 华南师范大学学报(自然科学版), 2009, 1(1): 49-51 .
THE ANALYSIS OF CURRENT TRANSPORT ON BASE IN ABRUPT InAlAs/InGaAs HBT BY HEAVY IMPURITY DOPING[J]. Journal of South China Normal University (Natural Science Edition), 2009, 1(1): 49-51 .
Citation: THE ANALYSIS OF CURRENT TRANSPORT ON BASE IN ABRUPT InAlAs/InGaAs HBT BY HEAVY IMPURITY DOPING[J]. Journal of South China Normal University (Natural Science Edition), 2009, 1(1): 49-51 .

基区重掺杂对InGaAs/InAlAs突变HBT电流输运的影响

THE ANALYSIS OF CURRENT TRANSPORT ON BASE IN ABRUPT InAlAs/InGaAs HBT BY HEAVY IMPURITY DOPING

  • 摘要: 摘要:基区重掺杂产生禁带变窄效应(BGN),从而导致HBT突变异质结界面的势垒高度发生改变,这会严重影响载流子的电流输运.本文基于Jain-Roulston禁带收缩模型及电流输运机理,对电子的传输进行了深入的分析,并与实验数据进行了比较,结果表明:在基区重掺杂的条件下,考虑BGN对电流输运的影响,对于准确描述电流的输运现象是非常有必要的.
    Abstract: Abstact: Heavy impurity doping brings about the so-called Band Gap Narrowing (BGN) effects, which will lead to the shift of the height of the energy barrier through the abrupt HBT interfaces that effects the transport of carriers a lot. In this article, the phenomenon of transport is discussed according to the J-R model and current transport mechanism. By comparison with the experimental data, it can be concluded that BGN is very necessary for an accurate description on the current transport mechanism.
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出版历程
  • 收稿日期:  2007-12-02
  • 修回日期:  2008-05-14
  • 刊出日期:  2009-02-24

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